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Semiconductor Science and Technology
Volumn 16, Issue 9, 2001, Pages 789-792
Scanning tunnelling microscopy and spectroscopy of nanocrystalline silicon films
(4)
Nogales, E
a
Mendez B
a
Piqueras, J
a
Plugaru, R
b
a
UNIVERSIDAD COMPLUTENSE DE MADRID
(
Spain
)
b
NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT IN MICROTECHNOLOGIES
(
Romania
)
Author keywords
[No Author keywords available]
Indexed keywords
ANNEALING; CHEMICAL VAPOR DEPOSITION; ION IMPLANTATION; POROUS SILICON; SCANNING TUNNELING MICROSCOPY;
QUANTUM CONFINEMENT EFFECT; SURFACE BAND GAP;
NANOSTRUCTURED MATERIALS;
EID
:
0035446278
PISSN
:
02681242
EISSN
:
None
Source Type
:
Journal
DOI
:
10.1088/0268-1242/16/9/309
Document Type
:
Article
Times cited : (
9
)
References (
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