Investigation of the surface topography of light emitting nanostructures of porous Si and the related photovoltaic effect by photoassisted scanning tunnelling microscopy

Thin Solid Films

Volumn 297, Issue 1-2, 1997, Pages 132-134

  Pavlov, A ^a   Pavlova, Y ^a  

^a UNIVERSITY OF TURKU   (Finland)

Author keywords

Porous silicon; Scanning tunnelling microscopy; Surface topography

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; NANOSTRUCTURED MATERIALS; PHOTOVOLTAIC EFFECTS; POROUS SILICON; SCANNING TUNNELING MICROSCOPY; SURFACES; THIN FILMS;

LIGHT EMITTING NANOSTRUCTURE; QUANTUM CONFINEMENT EFFECT; SURFACE PHOTOVOLTAGE MEASUREMENT; SURFACE TOPOGRAPHY;

SEMICONDUCTING SILICON;

EID: 0031117593     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09427-8     Document Type: Article

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