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Volumn 297, Issue 1-2, 1997, Pages 138-141

Observation of the photovoltaic and related effects in porous silicon by scanning tunneling microscopy

Author keywords

Photovoltaic effects; Porous silicon; Scanning tunneling microscopy; Single electron tunneling

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; LASER BEAM EFFECTS; PHOTOVOLTAIC EFFECTS; POROUS SILICON; SCANNING TUNNELING MICROSCOPY; SURFACES;

EID: 0031117219     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09530-2     Document Type: Article
Times cited : (11)

References (19)
  • 6
    • 84927421874 scopus 로고
    • M.K. Sheinkman and A.Yu. Shik, Fiz. Tekn. Poluprovodn., 12 (1976) 208; [Sov. Phys. Semicond. 12 (1976) 816].
    • (1976) Sov. Phys. Semicond. , vol.12 , pp. 816
  • 17
    • 0007033195 scopus 로고
    • A.V. Petrov and A.G. Petrukhin, Fiz. Tekh. Poluprovodn., 28 (1994) 82; Semiconductors, 28 (1994) 49.
    • (1994) Semiconductors , vol.28 , pp. 49


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.