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Volumn 16, Issue 9, 2001, Pages 806-811

Characterization of silica xerogel films by variable-angle spectroscopic ellipsometry and infrared spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; HYDROPHOBICITY; INFRARED SPECTROSCOPY; ORGANIC COMPOUNDS; PERMITTIVITY; POROSITY; REFRACTIVE INDEX; SPIN COATING;

EID: 0035443280     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/16/9/312     Document Type: Article
Times cited : (22)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.