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Volumn 92, Issue 1-3, 2001, Pages 249-256
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Fabrication and testing of custom vacuum encapsulations deposited by focused ion beam direct-write CVD
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Author keywords
Absolute pressure sensors; Direct write deposition; Focused ion beam; Three dimensional micromachining; Vacuum encapsulation; Vacuum packaging
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
ELECTRIC RESISTANCE MEASUREMENT;
ENCAPSULATION;
PRESSURE EFFECTS;
VACUUM APPLICATIONS;
CUSTOM VACUUM ENCAPSULATIONS;
FOCUSED ION BEAM;
VACUUM PACKAGING;
ION BEAM ASSISTED DEPOSITION;
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EID: 0035426222
PISSN: 09244247
EISSN: None
Source Type: Journal
DOI: 10.1016/S0924-4247(01)00557-X Document Type: Article |
Times cited : (9)
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References (20)
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