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Volumn 92, Issue 1-3, 2001, Pages 249-256

Fabrication and testing of custom vacuum encapsulations deposited by focused ion beam direct-write CVD

Author keywords

Absolute pressure sensors; Direct write deposition; Focused ion beam; Three dimensional micromachining; Vacuum encapsulation; Vacuum packaging

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTRIC RESISTANCE MEASUREMENT; ENCAPSULATION; PRESSURE EFFECTS; VACUUM APPLICATIONS;

EID: 0035426222     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(01)00557-X     Document Type: Article
Times cited : (9)

References (20)
  • 5
    • 0004616476 scopus 로고
    • Focused ion beam technology for integrated circuit modification, solid state technology
    • May
    • (1989) , pp. 270
    • Glanville, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.