Automatic functional test generation using the extended finite state machine model

Proceedings - Design Automation Conference

Volumn , Issue , 1993, Pages 86-91

  Cheng, Kwang Ting ^a   Krishnakumar, A S ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; FINITE AUTOMATA; NUMERICAL ANALYSIS; SEQUENTIAL CIRCUITS;

EXTENDED FINITE STATE MACHINES; FUNCTIONAL TEST GENERATION;

INTEGRATED CIRCUIT TESTING;

EID: 0027262858     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/157485.164585     Document Type: Conference Paper

References (17)