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Semiconductor Science and Technology

Volumn 16, Issue 8, 2001, Pages 733-738

New evidence on the relation between tunnelling and trap density at insulator/semiconductor interfaces

(1) Konofaos, N a

a UNIVERSITY OF IOANNINA (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRON TUNNELING; INTERFACES (MATERIALS); MATHEMATICAL MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SPECTROSCOPIC ANALYSIS; SUBSTRATES;

ADMITTANCE SPECTROSCOPY; SHOCKLEY-READ-HALL RECOMBINATION; THIN FILM INSULATORS; TRAP DENSITY;

MIS DEVICES;

EID: 0035421898 PISSN: 02681242 EISSN: None Source Type: Journal
DOI: 10.1088/0268-1242/16/8/317 Document Type: Article

Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.