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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 8, 2001, Pages 5074-5078

Interface and surface characterization of lead zirconate titanate thin films grown by sol-gel method

(5) Zhang, Qi a Ren, Tianling a Zhang, Lintao a Zhu, Jing a Li, Zhijian a

a TSINGHUA UNIVERSITY (China)

Author keywords

Ferroelectric PZT thin film; Interface; Microanalysis; Sol gel method; Surface

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; FILM GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); LEAD COMPOUNDS; SEMICONDUCTING SILICON; SOL-GELS; STOICHIOMETRY; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

RHOMBOHEDRAL STRUCTURES;

FERROELECTRIC THIN FILMS;

EID: 0035414986 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.40.5074 Document Type: Article

Times cited : (5)

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