SCOPUS 정보 검색 플랫폼

Journal of Materials Research

Volumn 16, Issue 7, 2001, Pages 1998-2006

Growth behavior and defects in conductive SrRuO3 thin films grown on a Si(100) substrate by sputtering

(2) Oh, Sang Ho a Park, Chan Gyung a

a Pohang University of Science and Technology (POSTECH) (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL GROWTH; MICROSTRUCTURE; OXYGEN; SILICON; SPUTTERING; STRONTIUM COMPOUNDS; THERMODYNAMIC STABILITY; THERMODYNAMICS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING;

ION-BEAM SPUTTERING;

THIN FILMS;

EID: 0035410847 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2001.0274 Document Type: Article

Times cited : (11)

References (26)

1
- 0027011540
- (1992) Science , vol.258 , pp. 1766
- Eom, C.B.¹ Cava, R.J.² Fleming, R.M.³ Philips, J.M.⁴ Van Dover, R.B.⁵ Marshall, J.H.⁶ Hsu, J.W.P.⁷ Krajewski, J.J.⁸ Peck W.F., Jr.⁹

2
- 0000547908
- (1995) Appl. Phys. Lett. , vol.67 , pp. 1387
- Hou, S.Y.¹ Kwo, J.² Watts, R.K.³ Cheng, J.-Y.⁴ Fork, D.K.⁵

3
- 36449005405
- (1995) Appl. Phys. Lett. , vol.66 , pp. 2197
- Jia, Q.X.¹ Wu, X.D.² Foltyn, S.R.³ Tiwari, P.⁴

4
- 0031222477
- (1997) Jpn. J. Appl. Phys. , vol.36 , pp. 5866
- Izuha, M.¹ Abe, K.² Fukushima, N.³

5
- 0031099120
- (1997) Appl. Phys. Lett. , vol.70 , pp. 1405
- Izuha, M.¹ Abe, K.² Koike, M.³ Takeno, S.⁴ Fukushima, N.⁵

6
- 0009197284
- (1998) IEEE IDEM , pp. 807
- Hieda, K.¹ Eguchi, K.² Fukushima, N.³ Ayoma, T.⁴ Natori, N.⁵ Kiyotoshi, M.⁶ Yamazaki, S.⁷ Izuha, M.⁸ Niwa, S.⁹ Fukuzumi, Y.¹⁰ Ishibashi, Y.¹¹ Kohyama, Y.¹² Arikado, T.¹³ Okumura, K.¹⁴

7
- 21544477571
- (1993) Appl. Phys. Lett. , vol.63 , pp. 2570
- Eom, C.B.¹ Van Dover, R.B.² Phillips, J.M.³ Werder, D.J.⁴ Marshall, J.H.⁵ Chen, C.H.⁶ Cava, R.J.⁷ Fleming, R.M.⁸ Fork, D.K.⁹

8
- 0000921241
- (1997) Appl. Phys. Lett. , vol.75 , pp. 3396
- Zin, J.¹ Lin, Z.G.² Wu, Z.C.³

9
- 0032688290
- (1999) J. Mater. Res. , vol.14 , pp. 1190
- Kim, J.H.¹ Chien, A.T.² Lange, F.F.³ Wills, L.⁴

10
- 21544457860
- (1995) Appl. Phys. Lett. , vol.62 , pp. 2434
- Wu, X.D.¹ Foltyn, S.R.² Dye, R.C.³ Coulter, Y.⁴ Muenchausen, R.E.⁵

11
- 0000164720
- (1994) Appl. Phys. Lett. , vol.64 , pp. 634
- Tiwari, P.¹ Wu, X.D.² Foltyn, S.R.³ Le, M.Q.⁴ Campbell, I.H.⁵ Dye, R.C.⁶ Muenchausen, R.E.⁷

12
- 0029212684
- Ferroelectric Thin Films IV, edited by S.B. Desu, B.A. Tuttle, R. Ramech, and T. Shiosaki (Pittsburgh, PA)
- (1995) Mater. Res. Soc. Symp. Proc. , vol.361 , pp. 47
- Wills, L.A.¹ Amano, J.²

13
- 0031130912
- (1997) Thin Solid Films , vol.299 , pp. 115
- Jia, Q.X.¹ Kung, H.H.² Wu, X.D.³

14
- 0030783219
- (1997) Mater. Res. Bull. , vol.32 , pp. 83
- Watanabe, K.¹ Ami, M.² Tanaka, M.³

15
- 0032661843
- (1999) Mater. Res. Bull. , vol.34 , pp. 933
- Dai, Z.R.¹ Son, S.Y.² Kim, B.S.³ Choi, D.K.⁴ Ohuchi, F.S.⁵

16
- 0028584536
- Epitaxial Oxide Thin Films and Heterostructures, edited by D.K. Fork, J.M. Phillips, R. Ramesh, and R.M. Wolf (Pittsburgh, PA)
- (1994) Mater. Res. Soc. Symp. Proc. , vol.341 , pp. 73
- Tarsa, E.J.¹ McCormick, K.L.² Speck, J.S.³

17
- 0004265777
- Prentice-Hall, Englewood Cliffs, NJ
- (1973) The Principle of Engineering Materials , pp. 74
- Barrett, C.R.¹ Nix, W.D.² Tetelman, A.S.³

18
- 0030291621
- (1996) J. Mater. Res. , vol.11 , pp. 2757
- Hubbard, K.J.¹ Schlom, D.G.²

19
- 0027544059
- (1993) Thin Solid Films , vol.224 , pp. 1
- Nagata, H.¹

20
- 0342357272
- (1997) J. Appl. Phys. , vol.81 , pp. 656
- Pretorious, R.¹ Harris, J.M.² Nicolet, M.-A.³

21
- 0000869871
- (1999) J. Appl. Phys. , vol.86 , pp. 1974
- Gasser, S.M.¹ Kolawa, E.² Nicolet, M.-A.³

22
- 0027541385
- (1993) J. Alloy. Comp. , vol.191 , pp. 219
- Mallika, C.¹ Sreedharan, O.M.²

23
- 0000857490
- (1987) J. Appl. Phys. , vol.61 , pp. 2398
- Kado, Y.¹ Arita, Y.²

24
- 0004177869
- IFI/Plenum, New York
- (1982) The Oxide Handbook, 2nd ed. , pp. 46
- Samsonov, G.V.¹

25
- 0000069367
- (1995) Appl. Phys. Lett. , vol.67 , pp. 2480
- Fahey, K.P.¹ Clemens, B.M.² Wills, L.A.³

26
- 0000711877
- (1994) Philos. Mag. B , vol.70 , pp. 1021
- Reĉnik, A.¹ Bruley, J.² Mader, W.³ Kolar, D.⁴ Rühle, M.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.