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Volumn 115, Issue 1, 2001, Pages 433-445
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Calculation of transmission coefficients at nonideal semiconductor interfaces characterized by a spatial distribution of barrier heights
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CHARGE TRANSFER;
CURRENT DENSITY;
CURRENT VOLTAGE CHARACTERISTICS;
RATE CONSTANTS;
SCHOTTKY BARRIER DIODES;
THERMIONIC EMISSION;
BARRIER HEIGHTS;
SEMICONDUCTOR INTERFACES;
INTERFACES (MATERIALS);
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EID: 0035397082
PISSN: 00219606
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1375154 Document Type: Article |
Times cited : (45)
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References (50)
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