Defect recognition via longitudinal mode analysis of high power fundamental mode and broad area edge emitting laser diodes

Journal of Applied Physics

Volumn 90, Issue 1, 2001, Pages 43-47

  Klehr, A ^a   Beister, G ^a   Erbert, G ^a   Klein, A ^a   Maege, J ^a   Rechenberg, I ^a   Sebastian, J ^a   Wenzel, H ^a   Trankle G ^a  

^a LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035395283     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1347408     Document Type: Article

References (9)

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