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Volumn 180, Issue 1-4, 2001, Pages 176-186
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Atomic-scale simulation of displacement cascades and amorphization in β-SiC
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Author keywords
Amorphization; Computer simulation; Defect production; Displacement cascade; SiC
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Indexed keywords
AMORPHIZATION;
COMPUTER SIMULATION;
CRYSTAL DEFECTS;
MOLECULAR DYNAMICS;
PROBABILITY;
DISPLACEMENT CASCADES;
SILICON CARBIDE;
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EID: 0035364529
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(01)00415-3 Document Type: Conference Paper |
Times cited : (59)
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References (35)
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