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Volumn 180, Issue 1-4, 2001, Pages 176-186

Atomic-scale simulation of displacement cascades and amorphization in β-SiC

Author keywords

Amorphization; Computer simulation; Defect production; Displacement cascade; SiC

Indexed keywords

AMORPHIZATION; COMPUTER SIMULATION; CRYSTAL DEFECTS; MOLECULAR DYNAMICS; PROBABILITY;

EID: 0035364529     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00415-3     Document Type: Conference Paper
Times cited : (59)

References (35)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.