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Microporous and Mesoporous Materials

Volumn 44-45, Issue , 2001, Pages 639-643

The interpretation of X-ray diffraction data for the determination of channel orientation in mesoporous films

(5) Hillhouse, H W a Van Egmond, J W a Tsapatsis, M a Hanson, J C b Larese, J Z b

a University of Massachusetts (United States)

b BROOKHAVEN NATIONAL LABORATORY (United States)

Author keywords

Ewalds construction; MCM 41; Mesoporous; Oriented film; X ray diffraction

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; SILICA; THIN FILMS; X RAY POWDER DIFFRACTION;

REFLECTION GEOMETRY;

MESOPOROUS MATERIALS;

FILM;

EID: 0035361749 PISSN: 13871811 EISSN: None Source Type: Journal
DOI: 10.1016/S1387-1811(01)00244-X Document Type: Article

Times cited : (67)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.