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Chemistry of Materials

Volumn 12, Issue 10, 2000, Pages 2888-2893

Synthesis and characterization of ordered arrays of topological defects in mesoporous silica films

(5) Hillhouse, H W a Van Egmond, J W a,c Tsapatsis, M a Hanson, J C b Larese, J Z b

a University of Massachusetts (United States)

b BROOKHAVEN NATIONAL LABORATORY (United States)

c UNION CARBIDE CORPORATION (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DIOXIDE;

ARTICLE; CHEMICAL ANALYSIS; CRYSTALLIZATION; FILM; LIQUID CRYSTAL; POROSITY; SYNTHESIS; X RAY DIFFRACTION;

EID: 0033787362 PISSN: 08974756 EISSN: None Source Type: Journal
DOI: 10.1021/cm000425k Document Type: Article

Times cited : (28)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.