Electroluminescence microscopy and spectroscopy of silicon nanocrystals in thin SiO2 layers

Optical Materials

Volumn 17, Issue 1-2, 2001, Pages 45-50

  Valenta, J ^a,b   Lalic, N ^a   Linnros, J ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b CHARLES UNIVERSITY   (Czech Republic)

Author keywords

Electroluminescence; Implantation; LED; Nanocrystals; Photoluminescence

Indexed keywords

ANNEALING; ELECTROLUMINESCENCE; ELECTRON EMISSION; ELECTRON TUNNELING; EMISSION SPECTROSCOPY; ION IMPLANTATION; LIGHT EMITTING DIODES; NANOSTRUCTURED MATERIALS; OPTICAL MICROSCOPY; PHOTOLUMINESCENCE; SEMICONDUCTING SILICON; SILICA; SUBSTRATES; THIN FILMS;

ELECTROLUMINESCENCE MICROSCOPY;

OPTICAL FILMS;

EID: 0035360632     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-3467(01)00019-2     Document Type: Conference Paper

References (16)