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Volumn 45, Issue 6, 2001, Pages 1017-1024
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Field emission from amorphous semiconductors
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Author keywords
Amorphous semiconductors; Atomic force microscopy; Defects; Displays; Field emission
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Indexed keywords
AMORPHOUS FILMS;
ATOMIC FORCE MICROSCOPY;
CARBON;
CRYSTAL DEFECTS;
ELECTRIC FIELD EFFECTS;
ELECTRIC SPACE CHARGE;
ELECTRON EMISSION;
FLAT PANEL DISPLAYS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DOPING;
AMORPHOUS SEMICONDUCTORS;
SEMICONDUCTING FILMS;
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EID: 0035359109
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/S0038-1101(00)00215-X Document Type: Article |
Times cited : (10)
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References (21)
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