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Volumn 45, Issue 6, 2001, Pages 1017-1024

Field emission from amorphous semiconductors

Author keywords

Amorphous semiconductors; Atomic force microscopy; Defects; Displays; Field emission

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; CARBON; CRYSTAL DEFECTS; ELECTRIC FIELD EFFECTS; ELECTRIC SPACE CHARGE; ELECTRON EMISSION; FLAT PANEL DISPLAYS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING;

EID: 0035359109     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(00)00215-X     Document Type: Article
Times cited : (10)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.