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Volumn 49, Issue 5, 2001, Pages 1021-1038

Failure behaviour of microstructures under torsional loads

Author keywords

A. Stress concentrations; B. Anisotropic material; B. Metallic materials; C. Finite elements; C. Mechanical testing

Indexed keywords

ANISOTROPY; FAILURE ANALYSIS; FINITE ELEMENT METHOD; STRESS CONCENTRATION; TORQUE MEASUREMENT; TORSION TESTING;

EID: 0035340680     PISSN: 00225096     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-5096(00)00063-6     Document Type: Article
Times cited : (13)

References (26)
  • 17
    • 0024883915 scopus 로고
    • Measurement of fracture stress, Young's modulus, and intrinsic stress of heavily boron-doped silicon microstructures
    • (1989) Thin Solid Films , vol.181 , pp. 251-258
    • Najafi, K.1    Suzuki, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.