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Volumn 40, Issue 5 A, 2001, Pages
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Metalorganic vapor phase epitaxial growth of high-quality AlInN/AlGaN multiple layers on GaN
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Author keywords
Al1 xInxN; AlGaN; Interface roughness; MOVPE; Multiple layers; Surface morphology; TEM; X ray satellite peaks
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Indexed keywords
FILM GROWTH;
HETEROJUNCTIONS;
LATTICE CONSTANTS;
METALLORGANIC VAPOR PHASE EPITAXY;
PHOTOLUMINESCENCE;
SEMICONDUCTING GALLIUM COMPOUNDS;
SURFACE ROUGHNESS;
THERMODYNAMIC STABILITY;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
INTERFACE ROUGHNESS;
SEMICONDUCTING ALUMINUM COMPOUNDS;
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EID: 0035329044
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.40.l420 Document Type: Article |
Times cited : (6)
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References (22)
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