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Volumn 42, Issue 8, 2001, Pages 3627-3632
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Investigation of the stiffness change in, the indentation force and the hydrophobic recovery of plasma-oxidized polydimethylsiloxane surfaces by tapping mode atomic force microscopy
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Author keywords
Polydimethylsiloxane; Tapping mode atomic force microscopy; X ray photoelectron spectroscopy
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Indexed keywords
DIMETICONE;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
MATHEMATICAL MODEL;
MOLECULAR DYNAMICS;
POLYMERIZATION;
RIGIDITY;
SURFACE PROPERTY;
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
CROSSLINKING;
DIFFUSION IN SOLIDS;
EQUATIONS OF MOTION;
HYDROPHOBICITY;
OXIDATION;
PLASMA APPLICATIONS;
STIFFNESS;
X RAY PHOTOELECTRON SPECTROSCOPY;
POLYDIMETHYLSILOXANE;
TAPPING MODE ATOMIC FORCE MICROSCOPY (TMAFM);
SILICONES;
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EID: 0035314281
PISSN: 00323861
EISSN: None
Source Type: Journal
DOI: 10.1016/s0032-3861(00)00738-2 Document Type: Article |
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Times cited : (47)
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References (22)
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