Auger electron appearance potential spectroscopy study of CrNx films

Surface and Interface Analysis

Volumn 31, Issue 4, 2001, Pages 291-296

  Chourasia, A R ^a   Hood, S J ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Auger electron appearance potential spectroscopy; Chromium nitride films; Unoccupied density of states; X ray photoelectron spectroscopy

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BINDING ENERGY; CHROMIUM COMPOUNDS; FERMI LEVEL; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER ELECTRON APPEARANCE POTENTIAL SPECTROSCOPY (AEAPS);

THIN FILMS;

EID: 0035306282     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.991     Document Type: Article

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