The intrinsic asymmetry of photoelectron peaks: Dependence on chemical state and role in curve fitting

Journal of Electron Spectroscopy and Related Phenomena

Volumn 95, Issue 1, 1998, Pages 45-56

  Salvia, A M ^a   Castle, James E ^b  

^a UNIVERSITY OF BASILICATA   (Italy)

^b UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

Curve fitting; Electron energy loss; XPS peak shape; XPS quantification

Indexed keywords

EID: 0001899930     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(98)00205-9     Document Type: Article

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