THz imaging in the near-field

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn 11, Issue , 1997, Pages 64-65

  Hunsche, S ^a   Koch, M ^a   Brener, I ^a   Nuss, M C ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; ELECTROMAGNETIC WAVE DIFFRACTION; MICROMETERS; OPTOELECTRONIC DEVICES; SCANNING; SILICON ON SAPPHIRE TECHNOLOGY; SPECTRUM ANALYSIS; SUBSTRATES; TIME DOMAIN ANALYSIS;

TIME DOMAIN TERAHERTZ SPECTROSCOPY;

IMAGING SYSTEMS;

EID: 0030713888     PISSN: 10928081     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)