Paramagnetic defects in silicon carbide grains embedded in SiO2 matrix

Diamond and Related Materials

Volumn 10, Issue 3-7, 2001, Pages 1287-1290

  Ehara, T ^a   Notake, K ^a   Handa, K ^a  

^a Ishinomaki Senshu University   (Japan)

Author keywords

Defect; Microstructure; Silicon carbide; Sputtering

Indexed keywords

ANNEALING; DEFECTS; PARAMAGNETIC RESONANCE; SPUTTERING;

DANGLING BOND (DB);

SILICON CARBIDE;

SILICON CARBIDE;

EID: 0035269455     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(00)00451-9     Document Type: Article

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