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Volumn 266-269 A, Issue , 2000, Pages 540-543
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Multi-band electron paramagnetic resonance study of the defects in microcrystalline silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000308987
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/s0022-3093(00)00027-2 Document Type: Article |
Times cited : (11)
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References (11)
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