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Volumn 346, Issue 1, 1999, Pages 275-279
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Effect of nitrogen doping on the structure of cluster or microcrystalline silicon embedded in thin SiO2 films
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CHEMICAL BONDS;
CRYSTAL MICROSTRUCTURE;
DOPING (ADDITIVES);
INFRARED SPECTROSCOPY;
NANOSTRUCTURED MATERIALS;
NITROGEN;
RAMAN SPECTROSCOPY;
SILICON;
SPUTTERING;
THIN FILMS;
RADIO-FREQUENCY COSPUTTERING;
SILICA;
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EID: 0033149561
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(98)01501-6 Document Type: Article |
Times cited : (19)
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References (16)
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