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Volumn 346, Issue 1, 1999, Pages 275-279

Effect of nitrogen doping on the structure of cluster or microcrystalline silicon embedded in thin SiO2 films

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHEMICAL BONDS; CRYSTAL MICROSTRUCTURE; DOPING (ADDITIVES); INFRARED SPECTROSCOPY; NANOSTRUCTURED MATERIALS; NITROGEN; RAMAN SPECTROSCOPY; SILICON; SPUTTERING; THIN FILMS;

EID: 0033149561     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01501-6     Document Type: Article
Times cited : (19)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.