Fabrication and characterization of Y-Ba-Cu-O and Nd-Ba-Cu-O ramp-edge junctions with an interface-modified barrier

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 155-158

  Makita, Takehiko ^a,b,c   Toma, Kazuyasu ^d,e   Ishikawa, Kazuhiro ^a   Zama, Hideaki ^a   Utagawa, Tadashi ^a   Kawabe, Ushio ^d   Tanabe, Keiichi ^a  

^a SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c OKI ELECTRIC INDUSTRY CO   (Japan)

^d CHIBA INSTITUTE OF TECHNOLOGY   (Japan)

^e TOPPAN PRINTING CO LTD   (Japan)

Author keywords

Interface barrier; Nd Ba Cu O; Ramp edge junction; Y Ba Cu O

Indexed keywords

INTERFACE MODIFIED BARRIER; NEODYMIUM BARIUM CUPRATES; RAMP EDGE JUNCTIONS; RESISTIVELY-SHUNTED JUNCTION;

ANNEALING; ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; ELECTRON CYCLOTRON RESONANCE; INTERFACES (MATERIALS); MAGNETIC FIELDS; NEODYMIUM COMPOUNDS; REACTIVE ION ETCHING; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES;

JOSEPHSON JUNCTION DEVICES;

EID: 0035269193     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919308     Document Type: Conference Paper

References (12)

1. x Josephson junctions on different substrates
2. 7 junctions by AFM
3. Correlation between ramp morphology and properties of ramp-type junctions
4. 7-δ studied by atomic force microscopy
5. c Josephson junctions
6. High-temperature superconducting edge-type Josephson junctions with modified interfaces
7. Preparation of ramp-edge Josephson junctions with natural barriers
8. The effect of spatial variation of barrier layer thickness on ramp-edge-type Josephson junction characteristics
9. c Josephson junction studied by transmission electron microscopy
10. x films prepared at substrate temperature lower than a-axis orientation
11. Analysis of the surface-modified barrier in YBaCuO ramp-edge Josephson junction
12. y-based interface-modified barrier