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Volumn 7, Issue 2 PART 3, 1997, Pages 2844-2847
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Correlation between ramp morphology and properties of ramp-type junctions
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CURRENT VOLTAGE CHARACTERISTICS;
ION BEAM LITHOGRAPHY;
MORPHOLOGY;
OXIDE SUPERCONDUCTORS;
YTTRIUM COMPOUNDS;
METALLIC CHANNELS;
RAMP-TYPE JUNCTIONS;
SUPERCONDUCTING FILMS;
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EID: 0031165926
PISSN: 10518223
EISSN: None
Source Type: Journal
DOI: 10.1109/77.621877 Document Type: Article |
Times cited : (20)
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References (10)
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