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Volumn 2, Issue 5, 2000, Pages 353-358
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Mapping concentration profiles within the diffusion layer of an electrode part III. Steady-state and time-dependent profiles via amperometric measurements with an ultramicroelectrode probe
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Author keywords
Amperometry; Concentration profile; Conproportionation; Nernst layer approximation; Ultramicroelectrode
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Indexed keywords
AMPEROMETRY;
ARTICLE;
DIFFUSION;
ELECTRODE;
MICROELECTRODE;
POTENTIOMETRY;
STEADY STATE;
VALIDATION PROCESS;
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EID: 0033829858
PISSN: 13882481
EISSN: None
Source Type: Journal
DOI: 10.1016/S1388-2481(00)00035-7 Document Type: Article |
Times cited : (60)
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References (19)
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