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Volumn 2, Issue 5, 2000, Pages 353-358

Mapping concentration profiles within the diffusion layer of an electrode part III. Steady-state and time-dependent profiles via amperometric measurements with an ultramicroelectrode probe

Author keywords

Amperometry; Concentration profile; Conproportionation; Nernst layer approximation; Ultramicroelectrode

Indexed keywords

AMPEROMETRY; ARTICLE; DIFFUSION; ELECTRODE; MICROELECTRODE; POTENTIOMETRY; STEADY STATE; VALIDATION PROCESS;

EID: 0033829858     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1388-2481(00)00035-7     Document Type: Article
Times cited : (60)

References (19)
  • 13
    • 0002274072 scopus 로고
    • I. Rubinstein (Ed.), Physical Electrochemistry: Principles, Methods and Applications, Marcel Dekker, New York, Ch. 4
    • (1995) , pp. 131-208
    • Amatore, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.