Measuring strain distribution during mesoscopic domain reorientation in a ferroelectric material

Journal of Engineering Materials and Technology, Transactions of the ASME

Volumn 120, Issue 1, 1998, Pages 1-6

  Park, S B ^a   Park, S S ^b   Carman, G P ^b   Hahn, H T ^b  

^a IBM MICROELECTRONICS   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CRACK INITIATION; FATIGUE OF MATERIALS; INTERFEROMETRY; LEAD COMPOUNDS; MICROCRACKS; PIEZOELECTRIC MATERIALS; STRAIN MEASUREMENT;

MESOSCOPIC DOMAIN REORIENTATION; MOIRE INTERFEROMETRY; POLARIZATION SWITCHING; STRAIN MISMATCH;

FERROELECTRIC MATERIALS;

EID: 0031646607     PISSN: 00944289     EISSN: 15288889     Source Type: Journal    
DOI: 10.1115/1.2806833     Document Type: Article

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