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Volumn 120, Issue 3, 1998, Pages 314-318

In situ evaluation of residual stresses in an organic die-attach adhesive

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CURING; EPOXY RESINS; EVALUATION; IMAGE PROCESSING; INTERFEROMETRY; ORGANIC COMPOUNDS; RESIDUAL STRESSES;

EID: 0032166506     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.2792639     Document Type: Article
Times cited : (30)

References (14)
  • 1
    • 0024733369 scopus 로고
    • Moire Interferometry for Simultaneous Measurement of U, V, W
    • Asundi, A., Cheung, M. T., Lee, C. S., 1989, “Moire Interferometry for Simultaneous Measurement of U, V, W," Experimental Mechanics, Vol. 29, No. 3, pp. 258-260.
    • (1989) Experimental Mechanics , vol.29 , Issue.3 , pp. 258-260
    • Asundi, A.1    Cheung, M.T.2    Lee, C.S.3
  • 2
    • 0005765931 scopus 로고
    • Thermal Strain Measurements in Electronic Packages Through Fractional Moiré Interferometry
    • Bastawros, A. F., and Voloshin, A. S., 1990, “Thermal Strain Measurements in Electronic Packages Through Fractional Moiré Interferometry,” ASME Journal of Electronic Packaging, Vol. 112, pp. 303-308.
    • (1990) ASME Journal of Electronic Packaging , vol.112 , pp. 303-308
    • Bastawros, A.F.1    Voloshin, A.S.2
  • 3
    • 0027708751 scopus 로고
    • Characterization of Silver Filled Adhesives for Attachment of Microelectronics Chips to Substrates
    • Bjorneklett, A., 1993, “Characterization of Silver Filled Adhesives for Attachment of Microelectronics Chips to Substrates,”Polymers and Polymer Composites, Vol. 4, pp. 275-282.
    • (1993) Polymers and Polymer Composites , vol.4 , pp. 275-282
    • Bjorneklett, A.1
  • 4
    • 0021124102 scopus 로고
    • Failure Mechanism of Die Cracking Due to Imperfect Die Attachment
    • Institute of Electrical and Electronics Engineers, Piscataway, NJ
    • Chiang, S. S., and Shukla, R. K., 1984, “Failure Mechanism of Die Cracking Due to Imperfect Die Attachment,” Proc. Of the 34th Electronic Components Conference, Institute of Electrical and Electronics Engineers, Piscataway, NJ, pp. 195-200.
    • (1984) Proc. Of the 34Th Electronic Components Conference , pp. 195-200
    • Chiang, S.S.1    Shukla, R.K.2
  • 5
    • 0020204149 scopus 로고
    • An Innovation in Materials for Attaching Silicon Device
    • Dietz, R., and Winder, L., 1982, “An Innovation in Materials for Attaching Silicon Device,”Int. J. Of Hybrid Microelectron, Vol. 5, pp. 480-486.
    • (1982) Int. J. Of Hybrid Microelectron , vol.5 , pp. 480-486
    • Dietz, R.1    Winder, L.2
  • 7
    • 0006847921 scopus 로고
    • Polymeric Materials for Electronics Packaging and Interconnection
    • American Chemical Society, Washington, DC
    • Lupinski, J. H., and Moore, R. S., 1989, “Polymeric Materials for Electronics Packaging and Interconnection,”A CS Symposium Series 407, American Chemical Society, Washington, DC, pp. 1-100.
    • (1989) A CS Symposium Series 407 , pp. 1-100
    • Lupinski, J.H.1    Moore, R.S.2
  • 8
    • 0022215818 scopus 로고
    • Use of Wetting Angle Measurements in Reliability Evaluations of Au-Si eutectic Die Attach
    • Institute of Electrical and Electronics Engineers, Piscataway, NJ
    • Mencinger, N. P., Carthy, M. P., and McDonald, R. C., 1985, “Use of Wetting Angle Measurements in Reliability Evaluations of Au-Si eutectic Die Attach,” Proc. Of the 23rd Annual Reliability Physics Conference, Institute of Electrical and Electronics Engineers, Piscataway, NJ, pp. 173-178.
    • (1985) Proc. Of the 23Rd Annual Reliability Physics Conference , pp. 173-178
    • Mencinger, N.P.1    Carthy, M.P.2    McDonald, R.C.3
  • 9
    • 0021120071 scopus 로고
    • Development of Adhesive Die Attach Technology in Cerdip Packages; Material Issues
    • Moghadam, F. K., 1984, “Development of Adhesive Die Attach Technology in Cerdip Packages; Material Issues,”Solid State Technol, Vol. 27, pp. 149-154.
    • (1984) Solid State Technol , vol.27 , pp. 149-154
    • Moghadam, F.K.1
  • 10
    • 0002595531 scopus 로고
    • Moire Interfereometry
    • chap. 7 in, Prentice-Hall, Inc., Englewood Cliffs, NJ
    • Post, D., 1987, “Moire Interfereometry,” chap. 7 in Handbookon Experimental Mechanics, Prentice-Hall, Inc., Englewood Cliffs, NJ, pp. 378-380.
    • (1987) Handbookon Experimental Mechanics , pp. 378-380
    • Post, D.1
  • 11
    • 34250603482 scopus 로고
    • Basic Optical Law in the Interpretation of Moire Pattern Applied to the Analysis of Strain—Part I
    • Sciammarella, C. A., 1965, “Basic Optical Law in the Interpretation of Moire Pattern Applied to the Analysis of Strain—Part I,”Experimental Mechanics, Vol. 5, pp. 154-160.
    • (1965) Experimental Mechanics , vol.5 , pp. 154-160
    • Sciammarella, C.A.1
  • 13
    • 0020498208 scopus 로고
    • The Quality of Die-Attachment and Its Relationship to Stresses and Vertical Die-Cracking
    • Institute of Electrical and Electronics Engineers, Piscataway, NJ
    • van Kessel, C. G. M., Gee, S. A., Murphy, J. J., 1983, “The Quality of Die-Attachment and Its Relationship to Stresses and Vertical Die-Cracking,” Proc. Of the 33rd Electronic Components, Institute of Electrical and Electronics Engineers, Piscataway, NJ, pp. 237-241.
    • (1983) Proc. Of the 33Rd Electronic Components , pp. 237-241
    • Van Kessel, C.G.M.1    Gee, S.A.2    Murphy, J.J.3
  • 14


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.