Built-in-chip testing of voltage overshoots in high-speed SoCs

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2001, Pages 111-116

  Attarha, A ^a   Nourani, M ^a  

^a UNIVERSITY OF TEXAS AT DALLAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; DIFFERENTIAL AMPLIFIERS; ELECTRIC BREAKDOWN; FLIP FLOP CIRCUITS; HOT CARRIERS; INDUCTANCE; INTEGRATED CIRCUIT TESTING; MOSFET DEVICES; RELIABILITY; THRESHOLD VOLTAGE; VLSI CIRCUITS;

HIGH SPEED SILICON ON CHIPS; VOLTAGE OVERSHOOTS;

BUILT-IN SELF TEST;

EID: 0035013111     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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