Signal integrity problems in deep submicron arising from interconnects between cores

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1998, Pages 28-33

  Nordholz, P ^a   Treytnar, D ^a   Otterstedt, J ^a   Grabinski, H ^a   Niggemeyer, D ^a   Williams, T W ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN FOR TESTABILITY; INTEGRATED CIRCUIT TESTING; INTERCONNECTION NETWORKS; MAGNETIC CORES; SIMULATION;

SIGNAL INTEGRITY;

APPLICATION SPECIFIC INTEGRATED CIRCUITS;

EID: 0032321261     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)