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Volumn 41, Issue 2, 2001, Pages 165-173

Advances in scanning electron microscope moiré

Author keywords

Carbonaceous; Grating; Lithography; Moir ; Scanning electron microscope

Indexed keywords

CASTING; DIFFRACTION GRATINGS; ELECTRON BEAM LITHOGRAPHY; PHOTOGRAPHY;

EID: 0034993574     PISSN: 00144851     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02323193     Document Type: Article
Times cited : (19)

References (27)
  • 18
    • 0033221784 scopus 로고    scopus 로고
    • Reliability of a flip-chip package thermally loaded between 55 degrees C and 125 degrees C
    • (1999) J. Electron. Mat , vol.28 , pp. 1150-1157
    • Drexler, E.S.1
  • 19
    • 0018243716 scopus 로고
    • Specimen contamination in analytical electron-microscopy - Sources and solutions
    • (1978) Ultramicroscopy , vol.3 , pp. 375-380
    • Hren, J.J.1
  • 23
    • 0030317572 scopus 로고    scopus 로고
    • An approach to the reduction of hydrocarbon contamination in the scanning electron microscope
    • (1996) Scanning , vol.18 , pp. 269-274
    • Postek, M.P.1
  • 26
    • 0023980956 scopus 로고
    • Formation and examination of self-supporting contamination filaments
    • (1988) Optik , vol.78 , pp. 158-164
    • Kreuzer, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.