Microstructures of grain boundaries in (001)-oriented strontium bismuth tantalate thin films grown by pulsed laser deposition

Applied Physics A: Materials Science and Processing

Volumn 72, Issue 4, 2001, Pages 503-507

  Zhu, X ^a   Zhu, T ^a   Liu, Z ^a   Ming, N ^a,b  

^a NANJING UNIVERSITY   (China)

^b CCAST WORLD LABORATORY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); ELECTRIC SPACE CHARGE; GRAIN BOUNDARIES; LEAKAGE CURRENTS; MORPHOLOGY; PULSED LASER DEPOSITION; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; VECTORS;

BISMUTH TANTALATE; BURGERS VECTOR; SPACE CHARGE LIMITED CONDUCTION MECHANISM;

THIN FILMS;

EID: 0034964786     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390100820     Document Type: Article

References (22)