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Volumn 71, Issue 1, 1997, Pages 81-83

Characterization of SrBi2Ta2O9 ferroelectric thin films deposited at low temperatures by plasma-enhanced metalorganic chemical vapor deposition

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Indexed keywords


EID: 0001904228     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119475     Document Type: Article
Times cited : (47)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.