Timing high-speed microprocessor circuits using picosecond imaging circuit analysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4308, Issue , 2001, Pages 53-58

  Steen, S E ^a   McManus, M K ^a   Manzer, D G ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

CMOS; Diagnostics; Failure analysis; Microprocessor; Photon emission; Picosecond imaging; VLSI

Indexed keywords

CMOS INTEGRATED CIRCUITS; DATA PROCESSING; MICROPROCESSOR CHIPS; PHOTOLUMINESCENCE; PHOTONS; PROGRAM DIAGNOSTICS; TIMING CIRCUITS; VLSI CIRCUITS;

PICOSECOND IMAGING CIRCUIT ANALYSIS (PICA);

IMAGING TECHNIQUES;

EID: 0034929888     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.424998     Document Type: Conference Paper

References (6)

1. Picosecond hot electron emission from submicron complementary metal oxide semiconductor circuits
2. Two-dimensional time-resolved imaging with 100-ps resolution using a resistive anode photomultiplier tube
3. Dynamic internal testing of CMOS circuits using hot luminescence
4. Proceedings from the 25th International Symposium for Testing and Failure Analysis
5. The attack of the "Holey Shmoos": A case study of advanced DFD and picosecond imaging circuit analysis (PICA)