Scanning nonlinear dielectric microscopy with nanometer resolution

Journal of the European Ceramic Society

Volumn 21, Issue 10-11, 2001, Pages 2131-2134

  Cho, Yasuo ^a   Kazuta, Satoshi ^a   Matsuura, Kaori ^a   Odagawa, Hiroyuki ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Ba TiO3 and titanates; Ferroelectric properties; PZT; Scanning nonlinear dielectric microscopy

Indexed keywords

IMAGING TECHNIQUES; MICROSCOPES; POLARIZATION; SCANNING; SINGLE CRYSTALS; THIN FILMS;

SCANNING NONLINEAR DIELECTRIC MICROSCOPE (SNDM);

DIELECTRIC MATERIALS;

CERAMICS;

EID: 0034883858     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(01)00187-X     Document Type: Article

References (6)

1. New microscope for measuring the distribution of nonlinear dielectric properties
2. Scanning nonlinear dielectric microscope
3. Scanning nonlinear dielectric microscope using a lumped constant resonator probe and its application to investigation of ferroelectric polarization distributions
4. Scanning nonlinear dielectric microscopy with nanometer resolution
5. Theoretical and experimental study on nanoscale ferroelectric domain measurement using scanning nonlinear dielectric microscopy
6. Theory of scanning nonlinear dielectric microscopy and application to quantitative evaluation