ADC testing based on IEEE 1057-94 Standard - some critical notes

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2000, Pages 119-124

  Arpaia, Pasquale ^a   Serra, Antonio Cruz ^a   Daponte, Pasquale ^a   Monteiro, Conceicao Libano ^a  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL SIGNAL PROCESSING; SENSITIVITY ANALYSIS; STANDARDS;

HISTOGRAM TESTING;

ANALOG TO DIGITAL CONVERSION;

EID: 0033705244     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)