Selecting test frequencies for two-tone phase plane analysis of ADC's

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 3, Issue , 2001, Pages 1843-1846

  Blair, J ^a  

^a BECHTEL CORPORATION   (United States)

Author keywords

ADC testing; Distortion compensation; Phase plane; Two tone tests

Indexed keywords

APPROXIMATION THEORY; FREQUENCIES; MATHEMATICAL MODELS; NUMERICAL METHODS; SPECTRUM ANALYSIS;

PHASE PLANE; TWO TONE PHASE PLANE ANALYSIS; TWO TONE SINEWAVE TEST;

ANALOG TO DIGITAL CONVERSION;

EID: 0034829275     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. The characterization and measurement of nonlinearities in transient measuring systems
2. Characterization of high-frequency analog-to-digital -converters for spectral analysis applications
3. Wideband distortion compensation for bipolar flash analog-to-digital converters
4. Characterization of ADCs using a non-iterative procedure
5. ADC architectural diagnostic testing procedures
6. Identification of error mechanisms in a folding and interpolating ADC
7. Fast compensation of analog-to-digital converters
8. Using sinewave histograms to estimate analog-to-digital converter dynamic error functions