SCOPUS 정보 검색 플랫폼

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

A new cell design for potentiostatically controlled in situ atomic force microscopy

(5) Madsen, L L a Friis, E P a Andersen, J E T a Moller P a Ulstrup, J a

a TECHNICAL UNIVERSITY OF DENMARK (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CELL DESIGN; CELL PERFORMANCE; CLOSED SYSTEMS; COMMERCIAL INSTRUMENTS; DESIGN AND CONSTRUCTION; GAS AMBIENTS; IN-SITU; LASER BEAM DEFLECTION; LEAKAGE PROBLEMS; POTENTIOSTATIC CONTROL; REDOX COUPLE; TWO COMPONENT SYSTEMS;

ATOMIC FORCE MICROSCOPY; OPTICAL INSTRUMENTS;

CYCLIC VOLTAMMETRY;

EID: 73149089642 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s003390051211 Document Type: Article

Times cited : (2)

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