Structural analysis of hexagonal mesoporous silica films produced from triblock-copolymer-structuring sol-gel

Studies in Surface Science and Catalysis

Volumn 129, Issue , 2000, Pages 673-682

  Grosso, D ^a   Balkenende, A R ^b   Albouy, P A ^c   Babonneau, F ^a  

^a SORBONNE UNIVERSITÉ   (France)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

^c UNIVERSITÉ PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COPOLYMER; SILICON DIOXIDE; SURFACTANT;

ANISOTROPY; CONFERENCE PAPER; FILM; POROSITY; REFRACTION INDEX; SURFACE PROPERTY; THICKNESS; X RAY DIFFRACTION;

EID: 0034590680     PISSN: 01672991     EISSN: None     Source Type: Book Series    
DOI: 10.1016/s0167-2991(00)80271-2     Document Type: Article

References (18)

1. K. Moller and T. Bein, Chem. Mater., 10 (1998) 2950.
2. K. Makita, Y. Akamatsu, A. Takamatsu, S. Yamazaki and Y. Abe, J. Sol-Gel Sci. and Tech., 14 (1999) 175.
3. J. Y. Ying, C. P. Mehnert and M. S. Wong, Angew. Chem. Int. Ed., 38 (1999) 56.
4. N. K. Raman, M. T. Anderson and C. J. Brinker, Chem. Mater., 8 (1996) 1682.
5. C. J. Brinker, Y. Lu, A. Sellinger and H. Fan, Adv. Mater., 11 (1999) 579.
6. J. C. Vartuli, K. D. Schmitt, C. T. Kresge, W. J. Roth, S. B. McCullen, S. D. Hellring, J. S. Beck, J. L. Schlenker, D. H. Olson and E. W. Sheppard, Chem. Mat., 6 (1994) 2317.
7. Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang and J. I. Zink, Nature, 389 (1997) 364.
8. D. Zhao, P. Yang, D. I. Margolese, B. F. Chmelka and G. D. Stucky, Chem. Commun., (1998) 2499.
9. M. Ogawa, H. Ishikawa and T. Kikuchi, J. Mater. Chem., 8 (1998) 1783.
10. S. H. Tolbert, T. E. Shaffer, J. Feng, P. K. Hansman and G. D. Stucky, Chem. Mater., 9 (1997) 1962.
11. D. Zhao, P. Yang, B. F. Chmelka and G. D. Stucky, Chem. Mater., 11 (1999) 1174.
12. D. Zhao, Q. Huo, J. Feng, B. F. Chmelka and G. D. Stucky, J. Am. Chem. Soc, 120 (1998) 6024.
13. D. Zhao, P. Yang, N. Melosh, B. F. Chmelka and G. D. Stucky, Adv. Mater., 10 (1998) 1380.
14. C. G. Goltner, S. Henke, M. C. Weissenberg and M. Antonietti, Angew. Chem. Int. Ed., 37 (1998) 613.
15. C. G. Goltner, B. Berton, E. Kramer and M. Antonietti, Chem. Comm., (1998) 2287.
16. D. Kundu, H. S. Zhou and I. Honma, J. Mater. Sci. Let., 17 (1998) 2089.
17. B. D. Cullity, Elements of X-Ray Diffraction, Addison-Wesley Publishing Company, London, (1956) 284.
18. V. Weindenhof, F. Gropper, U. Muller, L. Marosi, G. Cox, R. Houbertz and U. Hartmann, J. Mater. Res., 6 (1997) 1634.