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Journal of Materials Science Letters

Volumn 17, Issue 24, 1998, Pages 2089-2092

Thermally induced structural changes of lamellar and one-dimensional hexagonal mesoporous silica thin films

(3) Kundu, D a Zhou, H S b Honma, I b

a CSIR CENTRAL GLASS AND CERAMIC RESEARCH INSTITUTE (India)

b ELECTROTECHNICAL LABORATORY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CALCINATION; CHEMICAL BONDS; MOLECULAR STRUCTURE; MOLECULAR VIBRATIONS; PYROLYSIS; SHRINKAGE; SURFACE ACTIVE AGENTS; SYNTHESIS (CHEMICAL); THERMAL EFFECTS; THERMODYNAMIC STABILITY; X RAY DIFFRACTION ANALYSIS;

LOW-ANGLE X RAY DIFFRACTION (LAXRD) ANALYSIS; SPIN COATING;

SILICA;

EID: 0032274515 PISSN: 02618028 EISSN: None Source Type: Journal
DOI: 10.1023/A:1006684117323 Document Type: Article

Times cited : (42)

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