Atomic force microscopy investigation of dislocation structures and deformation characteristics in neutron-irradiated silicon detectors

Microelectronics Journal

Volumn 31, Issue 11-12, 2000, Pages 937-944

  Golan, G ^a   Rabinovich, E ^b   Inberg, A ^b   Oksman, M ^b   Rancoita, P G ^c   Rattaggi, M ^c   Gartsman, K ^d   Seidman, A ^b   Croitoru, N ^b  

^a HOLON INSTITUTE OF TECHNOLOGY   (Israel)

^b TEL AVIV UNIVERSITY   (Israel)

^c INFN SEZIONE DI MILANO   (Italy)

^d WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DISLOCATIONS (CRYSTALS); MICROHARDNESS; NEUTRON IRRADIATION; SCANNING ELECTRON MICROSCOPY;

NEUTRON-IRRADIATED SILICON DETECTORS;

SILICON SENSORS;

EID: 0034517260     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(00)00093-8     Document Type: Article

References (23)

1. Wunstorf R., Benkert M., Claussen N., Croitoru N., Fretwurst E., Lindstroem G., Schultz T. Nucl. Instrum. Meth. A. 315:1992;149.
2. Bosetti M., Croitoru N., Furetta C., Pensotti S., Rancoita P., Rattaggi M., Redaelli M., Seidman A. Nucl. Instrum. Meth. B. 95:1995;21.
3. Croitoru N., Gambirasio A., Rancoita P.G., Seidman A. Nucl. Instrum. Meth. B. 111:1996;297.
4. Croitoru N., Rancoita P.G., Rattaggi M., Rossi G., Seidman A. Nucl. Instrum. Meth. B. 114:1996;120.
5. Fretwurst E., Claussen J., Croitoru N., Papendick B., Pein U., Schatz H., Schultz T., Wunstorf R. Nucl. Instrum. Meth. A. 326:1993;357.
6. Croitoru N., Dahan R., Rancoita P.G., Rattaggi M., Rossi G., Seidman A. Nucl. Instrum. Meth. B. 124:1997;542.
7. Svensson B.G., Lindstrom J.L. J. Appl. Phys. 72:(12):1992;5616.
8. Svensson B.G., Willander M. J. Appl. Phys. 51:(16):1987;225.
9. Nabarro F.R.N., Duesbery M.S. Dislocations in Solids. vol. 7:1986.
10. Coeck M., Laermans C. J. Phys. IV. 6:(C8):1996;625-628.
11. Stefanov K., Hardalov Ch., Sueva D. Phys. Status. Solidi A. 163:(27):1997;2711.
12. Khivrich V., Varentsov M., Litovchenko P., Anokin A., Zinets O., Reinhard M., Rosenfeld A., Carolan M., Alexiev D. IEEE Trans Nucl. Sci. 43:(6):1996;2687.
13. Moll M., Feick H., Fretwurst E., Lindstrom G., Schutze C. Nucl. Instrum. Meth. Phys. Res., A. 388:1997;335-339.
14. Asom M., Benton J., Sauer R., Kimerling L. Appl. Phys. Lett. 51:(4):1987;256.
15. Senor D., Youngblood G., Moore C., Trimble D., Newsome G., Woods J. Fusion Technol. 30:(3):1996;943.
16. Park, In-Shik, DAI - B, 50/02 (1989) 713.
17. Cahn R.W., Haasen P. Physical Metallurgy. vol. 167:1987;196-205 Metallurgia, Moscow. (3rd revised and enlarged edition, russian translation).
18. Makin M. J. Metall. Fuels. 2:1959;500.
19. Makin M.J., Minter E.J. Acta Metall. 7:1959;361.
20. Hull D., Mogford I.L. Philos. Mag. 3:1958;1213.
21. Agarwal A., Gossman H.J., Eaglesham D.J., Pelaz L., Herner S.B., Jacobson D.C., Haynes T.E., Simonton R. Materials Science in Semiconductor Processing. 1:1998;17.
22. Zimmerman R., Gunther K. Metall. Werkstofftech. (Leipzig). 1982;20.
23. Golan G., Rabinovitch E., Axelevitch A., Klibanov L., Croitoru N., Seidman A. Diamond Films Technol. 7:(4):1997;257-266.