Achieving Fault-Tolerance by Shifted and Rotated Operands in TMR non-Diverse ALUs

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn Part F5373300, Issue , 2000, Pages 155-163

  Alderighi, Monica ^a   D'Angelo, Sergio ^a   Metra, Cecilia ^b   Sechi, Giacomo R ^a  

^a CNR   (Italy)

^b UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMMON MODE FAILURES; DESIGN COSTS; HIGH FAULT TOLERANCES; RELIABILITY PROBLEMS; TMR SYSTEMS; VERY DEEP SUB MICRONS;

FAULT TOLERANCE; FAULT TOLERANT COMPUTER SYSTEMS;

LOGIC DESIGN; RELIABILITY;

TRIPLE MODULAR REDUNDANCY (TMR);

EID: 0034509091     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFTVS.2000.887153     Document Type: Conference Paper

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