Design diversity metric and reliability analysis for redundant systems

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 662-671

  Mitra, Subhasish ^a   Saxena, Nirmal R ^a   McCluskey, Edward J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE; COMPUTER SIMULATION; COMPUTER SOFTWARE; FAILURE ANALYSIS; FIELD PROGRAMMABLE GATE ARRAYS; LOGIC PROGRAMMING; REDUNDANCY; RELIABILITY;

ADAPTIVE COMPUTING SYSTEMS; COMMON MODE FAILURES; DESIGN DIVERSITY; RELIABILITY ANALYSIS; TRIPLE MODULAR REDUNDANT;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0033325519     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (28)