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Volumn 221, Issue 1-4, 2000, Pages 111-116
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Real-time monitoring of ellipsometry monolayer oscillations during metalorganic vapor-phase epitaxy
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPOSITION EFFECTS;
CORRELATION METHODS;
ELLIPSOMETRY;
METALLORGANIC VAPOR PHASE EPITAXY;
MONOLAYERS;
OSCILLATIONS;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING INDIUM COMPOUNDS;
LAYER-BY-LAYER GROWTH;
MONOLAYER OSCILLATIONS;
SEMICONDUCTOR QUANTUM DOTS;
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EID: 0034504514
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(00)00663-1 Document Type: Article |
Times cited : (7)
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References (18)
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