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Volumn 221, Issue 1-4, 2000, Pages 111-116

Real-time monitoring of ellipsometry monolayer oscillations during metalorganic vapor-phase epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CORRELATION METHODS; ELLIPSOMETRY; METALLORGANIC VAPOR PHASE EPITAXY; MONOLAYERS; OSCILLATIONS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0034504514     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00663-1     Document Type: Article
Times cited : (7)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.