Embedded core testing using genetic algorithms

Proceedings of the Asian Test Symposium

Volumn , Issue , 2000, Pages 254-259

  Xu, Ruofan ^a   Hsiao, Michael S ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EMBEDDED CORE TESTING;

EMBEDDED SYSTEMS; GENETIC ALGORITHMS; INTEGRATED CIRCUIT LAYOUT; VECTORS;

INTEGRATED CIRCUIT TESTING;

EID: 0034497214     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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