Electronic part life cycle concepts and obsolescence forecasting

IEEE Transactions on Components and Packaging Technologies

Volumn 23, Issue 4, 2000, Pages 707-717

  Solomon, Rajeev ^b   Sandborn, Peter A ^a,c   Pecht, Michael G ^a,c  

^a IEEE

^b NORTEL NETWORKS   (Canada)

^c UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC RANDOM ACCESS STORAGE; ELECTRONICS INDUSTRY; INTEGRATED CIRCUITS; LIFE CYCLE; OBSOLESCENCE;

ELECTRONIC PARTS; LONG FIELD LIFE PRODUCTS;

TECHNOLOGICAL FORECASTING;

EID: 0034482466     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/6144.888857     Document Type: Article

References (12)

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