Risk-informed methodology for parts selection and management

Quality and Reliability Engineering International

Volumn 15, Issue 4, 1999, Pages 261-271

  Jackson, Margaret ^a   Sandborn, Peter ^a   Pecht, Michael ^a,c   Hemens Davis, Chantal ^b   Audette, Pierre ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b NORTEL NETWORKS   (Canada)

^c UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT; QUALITY CONTROL; RELIABILITY; RISK MANAGEMENT;

RISK-INFORMED METHODOLOGY;

TOTAL QUALITY MANAGEMENT;

EID: 0032658341     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-1638(199907/08)15:4<261::AID-QRE269>3.0.CO;2-0     Document Type: Article

References (4)

1. B. Foucher, R. Kennedy, N. Kelkar, Y. Ranade, A. Govind, W. Blake, A. Mathur and R. Solomon, 'Why a new parts selection and management program?', IEEE Trans. Compon., Pack., Manuf. Technol. A, CPMT-21, 375-382 (1998).
2. M. Jackson, A. Mathur, M. Pecht and R. Kendall, 'Manufacturer assessment process', Qual. Reliab. Engng. Int., 15, at press (1999).
3. IEEE, Standard Reliability Program for the Development and Production of Electronic Systems and Equipment, IEEE 1332-1998, 1998.
4. M. Wright, D. Humphrey and P. McCluskey, 'Uprating electronic components for use outside their temperature specification limits', IEEE Trans. Compon. Pack., Manuf. Technol., A, CMPT-20, 252-256 (1997).