Reconstruction and stoichiometry of CdTe(001) surfaces: A grazing incidence X-ray diffraction and reflection high energy electron diffraction study

Journal of Crystal Growth

Volumn 159, Issue 1-4, 1996, Pages 694-702

  Veron, M B ^a   Etgens, V H ^b   Sauvage Simkin, M ^a,b   Tatarenko, S ^c   Daudin, B ^d   Brun Le Cunff, D ^d  

^a SYNCHROTRON SOLEIL   (France)

^b UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^c CNRS   (France)

^d CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CALCULATIONS; CRYSTAL ATOMIC STRUCTURE; ELECTRON SCATTERING; EPITAXIAL GROWTH; MATHEMATICAL MODELS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; RELAXATION PROCESSES; STOICHIOMETRY; SURFACE STRUCTURE; SURFACES; X RAY CRYSTALLOGRAPHY;

ATOMIC LAYER EPITAXY; CADMIUM TELLURIDES; GRAZING INCIDENCE X RAY DIFFRACTION; RECONSTRUCTED DOMAIN DIMENSIONS; SURFACE RECONSTRUCTION;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0030562184     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(95)00775-X     Document Type: Article

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